发明名称 |
DISPOSITIF MICROELECTRONIQUE A TRANCHEES D'ISOLATION DEBORDANT SOUS UNE ZONE ACTIVE |
摘要 |
<p>The device (100) has a substrate (102) including a semiconductor layer (108) positioned on a dielectric layer (106), where the dielectric layer is positioned on another semiconductor layer (104). An isolation trench (114) is made through the former semiconductor layer, the dielectric layer and a part of the thickness of the latter semiconductor layer. The trench including silicon dioxide delimits an active area (110) of the device, where a portion (118) of the silicon dioxide of the trench is positioned under the active area in a part of the thickness of the latter semiconductor layer. An independent claim is also included for a method for producing a microelectronic device.</p> |
申请公布号 |
FR2995137(B1) |
申请公布日期 |
2015.12.11 |
申请号 |
FR20120058274 |
申请日期 |
2012.09.05 |
申请人 |
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIESALTERNATIVES |
发明人 |
VINET MAUD;GRENOUILLET LAURENT;LE TIEC YANNICK;WACQUEZ ROMAIN |
分类号 |
H01L21/76;H01L21/46;H01L27/085 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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