| 摘要 |
FIELD: instrumentation.SUBSTANCE: device comprises a base with a stand, an etching bath, sensors of sample deformation and thickness, an accessory attached to the stand for fixation of the sample and sample deformation and thickness sensors, at the same time sensors are connected to an information processing system, the thickness sensor includes two sensors covering the sample by thickness with their ends. The accessory for fixation of the sample and sensors is made in the form of a vertical frame attached to the stand by two movable consoles. In the lower part of the frame there is a clamp for console fixation of a tested sample in a vertical position, the deformation sensor comprises an extender made as capable of fixation on the upper end of the sample in vertical position, and a digital indicator. At the upper end of the extender there is a spring attached, by the second end connected to the digital indicator, the sample thickness sensor is equipped with a digital indicator. Levers of the thickness sensor are made as long, installed vertically, hingedly fixed on the frame, on the upper end of one of the levers there is a digital indicator, contacting by a measurement tip with the other lever, lower arms of levers are connected by the spring.EFFECT: increased accuracy of detection of residual stresses in surface layers of a part, simplified device design, reduction of impact of aggressive vapours of a reagent at sensor elements.2 cl, 1 dwg |
