发明名称 MRAM SMART BIT WRITE ALGORITHM WITH ERROR CORRECTION PARITY BITS
摘要 Some embodiments relate to a system that includes write circuitry, read circuitry, and comparison circuitry. The write circuitry is configured to attempt to write an expected multi-bit word to a memory location in a memory device. The read circuitry is configured to read an actual multi-bit word from the memory location. The comparison circuitry is configured to compare the actual multi-bit word read from the memory location with the expected multi-bit word which was previously written to the memory location to distinguish between a number of erroneous bits in the actual multi-bit word and a number of correct bits in the actual multi-bit word. The write circuitry is further configured to re-write the number of erroneous bits to the memory location without attempting to re-write the number of correct bits to the memory location.
申请公布号 US2015355963(A1) 申请公布日期 2015.12.10
申请号 US201514827591 申请日期 2015.08.17
申请人 Taiwan Semiconductor Manufacturing Co. Ltd. 发明人 Chih Yue-Der;Yu Hung-Chang;Lin Kai-Chun;Huang Chin-Yi;Tran Laun C.
分类号 G06F11/10;H03M13/00;H03M13/11 主分类号 G06F11/10
代理机构 代理人
主权项 1. A system, comprising: write circuitry configured to attempt to write an expected multi-bit word to a memory location in a memory device; read circuitry configured to read an actual multi-bit word from the memory location; and comparison circuitry configured to compare the actual multi-bit word read from the memory location with the expected multi-bit word which was previously written to the memory location to distinguish between a number of erroneous bits in the actual multi-bit word and a number of correct bits in the actual multi-bit word; wherein the write circuitry is further configured to re-write the number of erroneous bits to the memory location without attempting to re-write the number of correct bits to the memory location.
地址 Hsin-Chu TW