发明名称 X-RAY DIFFRACTION MEASUREMENT METHOD
摘要 PROBLEM TO BE SOLVED: To make an incident angle of an X-ray with respect to a measurement object be a setting value accurately even though the measurement object has a complex shape.SOLUTION: By sticking a leveling instrument LV or a leveling instrument LH to a measurement spot of a measurement object OB to adjust the posture of the measurement object OB, the measurement spot of the measurement object OB is made horizontal. Then, from an X-ray diffraction measurement apparatus which can accurately adjust an angle to a gravity direction of the optical axis of an X-ray with respect to the measurement spot or which has the angle to the gravity direction of the optical axis of the X-ray fixed to a setting value, the X-ray is emitted and the generated diffraction light of the X-ray is received to image a diffraction ring.
申请公布号 JP2015222235(A) 申请公布日期 2015.12.10
申请号 JP20140107326 申请日期 2014.05.23
申请人 PULSTEC INDUSTRIAL CO LTD 发明人 FUJITA NOBUYA
分类号 G01N23/207 主分类号 G01N23/207
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