发明名称 |
SEMICONDUCTOR STRUCTURE, RESISTIVE RANDOM ACCESS MEMORY UNIT STRUCTURE, AND MANUFACTURING METHOD OF THE SEMICONDUCTOR STRUCTURE |
摘要 |
A semiconductor structure, a resistive random access memory unit structure, and a manufacturing method of the semiconductor structure are provided. The semiconductor structure includes an insulating structure, a stop layer, a metal oxide layer, a resistance structure, and an electrode material layer. The insulating structure has a via, and the stop layer is formed in the via. The metal oxide layer is formed on the stop layer. The resistance structure is formed at a bottom of an outer wall of the metal oxide layer. The electrode material layer is formed on the metal oxide layer. |
申请公布号 |
US2015357562(A1) |
申请公布日期 |
2015.12.10 |
申请号 |
US201414297689 |
申请日期 |
2014.06.06 |
申请人 |
Macronix International Co., Ltd. |
发明人 |
Lin Yu-Yu;Lee Feng-Min;Lee Ming-Hsiu |
分类号 |
H01L45/00 |
主分类号 |
H01L45/00 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor structure, comprising:
an insulating structure having a via; a stop layer formed in the via; a metal oxide layer formed on the stop layer; a resistance structure formed at a bottom of an outer wall of the metal oxide layer, wherein a top surface of the resistance structure is below a top surface of the metal oxide layer; and an electrode material layer formed on the metal oxide layer. |
地址 |
Hsinchu TW |