发明名称 SEMICONDUCTOR STRUCTURE, RESISTIVE RANDOM ACCESS MEMORY UNIT STRUCTURE, AND MANUFACTURING METHOD OF THE SEMICONDUCTOR STRUCTURE
摘要 A semiconductor structure, a resistive random access memory unit structure, and a manufacturing method of the semiconductor structure are provided. The semiconductor structure includes an insulating structure, a stop layer, a metal oxide layer, a resistance structure, and an electrode material layer. The insulating structure has a via, and the stop layer is formed in the via. The metal oxide layer is formed on the stop layer. The resistance structure is formed at a bottom of an outer wall of the metal oxide layer. The electrode material layer is formed on the metal oxide layer.
申请公布号 US2015357562(A1) 申请公布日期 2015.12.10
申请号 US201414297689 申请日期 2014.06.06
申请人 Macronix International Co., Ltd. 发明人 Lin Yu-Yu;Lee Feng-Min;Lee Ming-Hsiu
分类号 H01L45/00 主分类号 H01L45/00
代理机构 代理人
主权项 1. A semiconductor structure, comprising: an insulating structure having a via; a stop layer formed in the via; a metal oxide layer formed on the stop layer; a resistance structure formed at a bottom of an outer wall of the metal oxide layer, wherein a top surface of the resistance structure is below a top surface of the metal oxide layer; and an electrode material layer formed on the metal oxide layer.
地址 Hsinchu TW