发明名称 CIGS FILM PRODUCTION METHOD, AND CIGS SOLAR CELL PRODUCTION METHOD USING THE CIGS FILM PRODUCTION METHOD
摘要 A CIGS film production method capable of suppressing oxidation of a front surface of a CIGS film, and a CIGS solar cell production method using the CIGS film production method includes the steps of: forming a first region having a Ga/(In+Ga) ratio progressively reduced as the thickness of the first region increases to a predetermined first thickness position from a back surface of the CIGS film; forming a second region having a Ga/(In+Ga) ratio progressively increased as the thickness of the second region increases to a predetermined second thickness position from the first region; and forming a third region on the second region by vapor-depositing Se and In, the third region having a Ga/(In+Ga) ratio progressively reduced toward a front surface of the CIGS film.
申请公布号 US2015357492(A1) 申请公布日期 2015.12.10
申请号 US201414762940 申请日期 2014.01.24
申请人 NITTO DENKO CORPORATION 发明人 Teraji Seiki;Watanabe Taichi;Nishii Hiroto;Yamamoto Yusuke;Kawamura Kazunori;Minemoto Takashi;Chantana Jakapan
分类号 H01L31/0392;H01L31/18 主分类号 H01L31/0392
代理机构 代理人
主权项 1. A production method for a CIGS film to be used as a light absorbing layer for a CIGS solar cell, the method comprising the steps of: forming a first region having a Ga/(In+Ga) ratio progressively reduced from a back surface of the CIGS film toward a front surface of the CIGS film; forming a second region on the first region, the second region having a Ga/(In+Ga) ratio progressively increased toward a front surface of the CIGS film; and forming a third region on the second region by vapor-depositing selenium (Se) and indium (In), the third region having a Ga/(In+Ga) ratio progressively reduced toward the front surface of the CIGS film; wherein the Ga/(In+Ga) ratios are each defined as a ratio of a gallium (Ga) atomic number concentration to a sum of an indium (In) atomic number concentration and the gallium (Ga) atomic number concentration.
地址 Ibaraki-shi, Osaka JP
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