| 发明名称 |
METHOD FOR DETECTING HYSTERESIS CHARACTERISTIC OF COMPARATOR AND SEMICONDUCTOR DEVICE |
| 摘要 |
A method for detecting a hysteresis characteristic of a comparator, include: causing a controller to control an offset adjuster configured to adjust an offset amount of the comparator; causing the controller to change the offset amount from a first value toward a second value and detect a third value when a logic level of a signal output from the comparator is changed; causing the controller to change the offset amount from the second value toward the first value and detect a fourth value when the logic level is changed; and causing the controller to detect the hysteresis characteristic of the comparator based on a first difference between the third value and the fourth value. |
| 申请公布号 |
US2015358006(A1) |
申请公布日期 |
2015.12.10 |
| 申请号 |
US201514728730 |
申请日期 |
2015.06.02 |
| 申请人 |
FUJITSU LIMITED |
发明人 |
CHEN Yanfei |
| 分类号 |
H03K5/003;H03K5/24 |
主分类号 |
H03K5/003 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method for detecting a hysteresis characteristic of a comparator, comprising:
causing a controller to control an offset adjuster configured to adjust an offset amount of the comparator; causing the controller to change the offset amount from a first value toward a second value and detect a third value when a logic level of a signal output from the comparator is changed; causing the controller to change the offset amount from the second value toward the first value and detect a fourth value when the logic level is changed; and causing the controller to detect the hysteresis characteristic of the comparator based on a first difference between the third value and the fourth value. |
| 地址 |
Kawasaki-shi JP |
