发明名称 |
FAST ABSOLUTE-REFLECTANCE METHOD FOR THE DETERMINATION OF TEAR FILM LIPID LAYER THICKNESS |
摘要 |
<p>A method of determining tear film lipid layer thickness. The method includes the steps of measuring a tear film aqueous plus lipid layer relative reflectance spectrum using a wavelength- dependent optical interferometer; converting the measured tear film aqueous plus lipid layer relative reflectance spectrum to a calculated absolute reflectance spectrum; and comparing the calculated absolute reflectance spectrum to a theoretical absolute lipid reflectance spectrum to determine a tear film lipid layer thickness.</p> |
申请公布号 |
WO2015187315(A1) |
申请公布日期 |
2015.12.10 |
申请号 |
WO2015US30385 |
申请日期 |
2015.05.12 |
申请人 |
ABBOTT MEDICAL OPTICS INC. |
发明人 |
HUTH, STAN;TRAN, DENISE |
分类号 |
A61B3/10 |
主分类号 |
A61B3/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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