发明名称 FAST ABSOLUTE-REFLECTANCE METHOD FOR THE DETERMINATION OF TEAR FILM LIPID LAYER THICKNESS
摘要 <p>A method of determining tear film lipid layer thickness. The method includes the steps of measuring a tear film aqueous plus lipid layer relative reflectance spectrum using a wavelength- dependent optical interferometer; converting the measured tear film aqueous plus lipid layer relative reflectance spectrum to a calculated absolute reflectance spectrum; and comparing the calculated absolute reflectance spectrum to a theoretical absolute lipid reflectance spectrum to determine a tear film lipid layer thickness.</p>
申请公布号 WO2015187315(A1) 申请公布日期 2015.12.10
申请号 WO2015US30385 申请日期 2015.05.12
申请人 ABBOTT MEDICAL OPTICS INC. 发明人 HUTH, STAN;TRAN, DENISE
分类号 A61B3/10 主分类号 A61B3/10
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