IN-PACKAGE TEMPERATURE SENSOR AND METHODS THEREFOR

摘要

This disclosure relates generally to an electronic assembly and methods that include a dielectric material forming a cavity, a magnet positioned to induce a magnetic field within the cavity, a conductive trace positioned, at least in part, within the cavity, and a frequency detection circuit configured to detect the frequency of the maximal electromotive force as induced and produce an output proportional to a temperature of the conductive trace. The conductive trace resonates within the cavity based on a temperature-dependent resonant frequency of the conductive trace and a sinusoidal current induced through the conductive trace by a current source, the sinusoidal current induces a maximal electromotive force when a frequency of the sinusoidal current has an approximately equal magnitude to the temperature-dependent resonant frequency of the conductive trace, and the maximal electromotive force, as induced, has a substantially equal frequency as the temperature-dependent resonant frequency of the conductive trace.

主权项

1. An electronic assembly, comprising:
a dielectric material forming a cavity; a magnet positioned to induce a magnetic field within the cavity; a conductive trace positioned, at least in part, within the cavity, wherein:
the conductive trace resonates within the cavity based on a temperature-dependent resonant frequency of the conductive trace and a sinusoidal current induced through the conductive trace by a current source;the sinusoidal current induces a maximal electromotive force when a frequency of the sinusoidal current has an approximately equal magnitude to the temperature-dependent resonant frequency of the conductive trace; andthe maximal electromotive force, as induced, has a substantially equal frequency as the temperature-dependent resonant frequency of the conductive trace; and a frequency detection circuit configured to detect the frequency of the maximal electromotive force as induced and produce an output proportional to a temperature of the conductive trace.