发明名称 DETERMINING QUANTITATIVE THREE-DIMENSIONAL SURFACE TOPOGRAPHY FROM TWO-DIMENSIONAL MICROSCOPY IMAGES
摘要 Sets of displacements of corresponding points between a first image and a second and third image are determined. Directional components in two directions of each set of displacements are fitted to two respective fitting planes. From the directional components, the relative displacements, each indicating a difference between the displacement of corresponding points and a calculated displacement of corresponding points on the respective fitting plane are calculated. An orientation of a sample plane for each image and the angle and the axis of rotation of the sample plane is calculated by requiring that for at least two types of physical parameters, the value resulting from the first set of displacements is identical to the value resulting from the second set of displacements. Three-dimensional surface topography data are determined from the calculated orientations and the angle and axis of rotation of the sample plane and the first or second relative displacements.
申请公布号 WO2015185538(A1) 申请公布日期 2015.12.10
申请号 WO2015EP62231 申请日期 2015.06.02
申请人 RIJKSUNIVERSITEIT GRONINGEN 发明人 MARTÍNEZ MARTÍNEZ, DIEGO;OCELIK, VACLAV;DE HOSSON, JOSEPHUS THEODORUS MARIA;MANSILLA SANCHEZ, CATALINA;FABER, ENNE THEODOOR
分类号 G06T7/00 主分类号 G06T7/00
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