发明名称 MULTI-CONFIGURABLE TESTING MODULE FOR AUTOMATED TESTING OF A DEVICE
摘要 In an embodiment, a testing apparatus includes an air mixing chamber, a docking unit, and a DUT (device under test) test execution unit. The air mixing chamber includes a first air inlet operable to receive a first air flow, a second air inlet operable to receive a second air flow, and an air outlet operable to output a mixed air flow. The docking unit is operable to receive and to securely hold a DUT (device under test) receptacle including an electrical interface, an air flow interface, and a DUT coupled to the electrical interface. The DUT receptacle is configured to enclose and hold inside the DUT. The docking unit is operable to couple to the electrical interface and to the air flow interface. The docking unit is operable to receive and to send the mixed air flow to the DUT receptacle. A DUT test execution unit is coupled to the docking unit. The DUT test execution unit is operable to perform a test on the DUT that is inside of the DUT receptacle.
申请公布号 US2015355270(A1) 申请公布日期 2015.12.10
申请号 US201514736070 申请日期 2015.06.10
申请人 Advantest Corporation 发明人 ROGEL-FAVILA Ben;FISHMAN James
分类号 G01R31/28;G01R1/04 主分类号 G01R31/28
代理机构 代理人
主权项 1. A testing apparatus, comprising: an air mixing chamber including a first air inlet operable to receive a first air flow, a second air inlet operable to receive a second air flow, and an air outlet operable to output a mixed air flow; a docking unit operable to receive and to securely hold a DUT (device under test) receptacle including an electrical interface, an air flow interface, and a DUT coupled to the electrical interface, wherein the DUT receptacle is configured to enclose and hold inside the DUT, wherein further the docking unit is operable to couple to the electrical interface and to the air flow interface, wherein the docking unit is operable to receive and to send the mixed air flow to the DUT receptacle; and a DUT test execution unit coupled to the docking unit, wherein the DUT test execution unit is operable to perform a test on the DUT that is disposed inside of the DUT receptacle.
地址 Tokyo JP