UNIVERSAL TEST FLOOR SYSTEM

摘要

In an embodiment, a universal test floor system includes a first robot that is configured to pack a plurality of universal test containers each including similar dimensions into a universal bin. Each universal test container is configured to enclose each of a plurality of different devices to test. The universal test floor system includes a universal conveyor configured to transport the universal bin. The first robot is configured to put the universal bin onto the universal conveyor and a second robot is configured to remove it. A universal test cell system is configured to receive the universal bin. The universal test cell system includes a plurality of test slots configured to receive a plurality of universal test containers. The universal test cell system is configured to test the plurality of different devices while each is located within one of the plurality of universal test containers.

主权项

1. A universal test floor system comprising:
a first robot configured to pack a plurality of universal test containers each comprising similar dimensions into a universal bin, each universal test container is configured to enclose each of a plurality of different devices to test, each universal test container comprises an external electrical interface configured to couple to each of said plurality of different devices to test; a universal conveyor configured to transport said universal bin, said first robot configured to put said universal bin onto said universal conveyor; a second robot configured to remove said universal bin from said universal conveyor; and a universal test cell system configured to receive said universal bin, said universal test cell system comprising a plurality of test slots configured to receive a plurality of universal test containers, said universal test cell system is configured to test said plurality of different devices while each is located within a universal test container of said plurality of universal test containers, said universal test cell system comprises a plurality of universal electrical interfaces that are each configured to couple with said external electrical interface of each universal test container.