| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To speed up test time of jitter detection and to enhance test accuracy. <P>SOLUTION: In a jitter detector 10, High width and Low width of a clock signal to be tested obtained by synchronizing a clock signal outputted by a device 20 to be tested with a different high speed reference clock are counted, and jitter is detected for every half period by comparing reference values of the High width and the Low width of the clock signal to be tested with the counted values of the High width and the Low width. <P>COPYRIGHT: (C)2013,JPO&INPIT</p> |
