发明名称 PATTERN FORMING METHOD OF FUNCTIONAL FILM
摘要 <P>PROBLEM TO BE SOLVED: To provide a highly versatile, simple and practical pattern forming method of a functional film, capable of forming the functional film using a high temperature process. <P>SOLUTION: The method comprises: a step of directly or indirectly forming a first sacrifice layer to be selectively etched with a specified etchant on a substrate; a step of forming a second sacrifice layer whose resistance against thermal or physical action force is weaker than the first sacrifice layer on the first sacrifice layer; a step of forming the functional film by a functional material on the substrate on which the first and the second sacrifice layers are formed; a step of forming a passing hole, a crack or a gap for making the specified etchant reach the first sacrifice layer by applying the thermal and/or physical action force to the second sacrifice layer and partially removing the second sacrifice layer; and a step of removing the first and the second sacrifice layers and the functional film on the second sacrifice layer by etching the first sacrifice layer through the passing hole or the like using the specified etchant. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009021518(A) 申请公布日期 2009.01.29
申请号 JP20070184734 申请日期 2007.07.13
申请人 FUJIFILM CORP 发明人 HISHINUMA KEIICHI;FUJII TAKAMITSU
分类号 H01L21/306;B81C1/00;H01L41/18;H01L41/22;H01L41/316;H01L41/331 主分类号 H01L21/306
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