| 摘要 |
Provided in the present invention is an apparatus to detect a defect on a surface of a thick steel plate surface, comprising: a surface image filming unit to film the surface of a thick plate to generate an original video; a first defect detection unit which includes a filtering unit to filter the original video to generate a filtering video, including a first binarizing unit for binarizing the filtering video to generate a first binarized video, thus detecting a first defect from the first binarized video; and a second defect detection unit, including a second binarizing unit for binarizing the original video based on a baseline value concerning each pixel row of the original video to generate a second binarized video of the original video, which includes a defect candidate detection unit to generate a defect candidate binarized video by merging the first and second binarized videos, thus classifying at least two second defects on each blob of the binarized video. Other than unevenness defects, in descending order, oil defect, chip defect, scrap and scale are detected step-by-step; thereby being able to detect and classify the defects of which patterns are not shown by cross-lighting. |
