| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a test device and the like enabled to guarantee test-pattern safety in generation of a test power-considered test. <P>SOLUTION: A test device for use in presence/absence of a failure in a logic circuit includes: means that is given an initial test cube, assigns a logic value to an initial undetermined value bit and generates an intermediate test pattern; means for determining test-pattern safety meaning that no risk bit exists if no failure occurs in a logic circuit to which a test pattern is applied; means for specifying a candidate bit possibly contributing to guaranteeing test-pattern safety; means for generating a new test cube using an input bit of the intermediate test pattern corresponding to both of the initial undetermined bit and the candidate bit as a new undetermined bit; means for generating a final test pattern by assigning a logic value to the new undetermined bit; means for determining final-test-pattern safety; and mask means for inhibiting use of a risk bit in a logic circuit test. <P>COPYRIGHT: (C)2013,JPO&INPIT |
