Method and apparatus for the contactless determination of electrical quantities

摘要

Contactless determination of electrical parameters. The examples describe a method and apparatus for determining electrical parameters of assemblies (printed circuit boards and as well as passive components) by the contactless determination of the spatial distribution of material. The spatial distribution of material (two-dimensional or three dimensional), is determined for example by measurement by radiographic technology with an X-ray machine or a computer tomography or by an optical instrument. The electrical parameter is determined in each volume element whose size is determined by the resolution of the method used for determining the material distribution, or a partial structure of the conductive structure.

主权项

1. A method for determining electrical parameters, comprising: determining a material distribution of a conductive structure, by a non-contacting measurement apparatus to measure a spatial arrangement of at least one material making up the conductive structure; and
determining electrical parameters of the conductive structure by calculating at least one electrical parameter based upon the measured spatial arrangement of the at least one material and known electrical properties of the at least one material whereby the measured spatial arrangement of the conductive structure is divided into a plurality of elements, and where a material contained in each element of the plurality of elements is identified from a recorded image of the conductive structure, and electrical properties of the material are assigned to each element of the plurality of elements and the plurality of elements electrical properties so obtained are used to determine electrical parameters of the conductive structure.