发明名称 Vertical structure semiconductor memory devices and methods of manufacturing the same
摘要 A semiconductor memory device includes: a semiconductor region extending vertically from a first region of a substrate; a plurality of gate electrodes disposed on the first region of the substrate in a vertical direction, but separated from each other along a sidewall of the semiconductor region; a gate dielectric layer disposed between the semiconductor region and the plurality of gate electrodes; a substrate contact electrode extending vertically from the impurity-doped second region of the substrate; and an insulating region formed as an air gap between the substrate contact electrode and at least one of the plurality of gate electrodes.
申请公布号 US9208885(B2) 申请公布日期 2015.12.08
申请号 US201313920926 申请日期 2013.06.18
申请人 Samsung Electronics Co., Ltd. 发明人 Hwang Sung-Min;Kim Hansoo;Shim Sun-Il
分类号 H01L27/088;G11C16/08;H01L27/115;H01L29/78;H01L23/48 主分类号 H01L27/088
代理机构 Harness, Dickey & Pierce, P.L.C. 代理人 Harness, Dickey & Pierce, P.L.C.
主权项 1. A semiconductor memory device comprising: a semiconductor region extending vertically from a first region of a substrate; a plurality of gate electrodes disposed on the first region of the substrate in a vertical direction, the plurality of gate electrodes being separated from one another and being disposed along a sidewall of the semiconductor region; a gate dielectric layer disposed between the semiconductor region and the plurality of gate electrodes; a substrate contact electrode extending vertically from an impurity-doped second region of the substrate, the substrate contact electrode extending from the substrate to a height greater than that of an uppermost gate electrode from among the plurality of gate electrodes; and an insulating region formed as an air gap between the substrate contact electrode and at least one of the plurality of gate electrodes.
地址 Gyeonggi-do KR