Fail address detector, semiconductor memory device including the same and method of detecting fail address

摘要

A fail address detector includes cam latch groups configured to store fail addresses and a comparing section connected to the cam latch groups in common and configured to detect whether or not a fail address corresponding to a comparison address exists among the fail addresses received from the cam latch groups. The cam latch groups share the comparing section in time division.

主权项

1. A fail address detector, comprising:
cam latch groups configured to store fail addresses, respectively, wherein each of the fail addresses indicates a defect area; and a comparing section connected to the cam latch groups in common and configured to detect whether or not a fail address corresponding to a comparison address exists among the fail addresses received from the cam latch groups, wherein the cam latch groups are configured to share the comparing section in time division by sequentially transmitting the fail addresses to the comparing section, wherein the cam latch groups are configured to receive cam enable signals, respectively, the cam enable signals being activated sequentially, and wherein the cam latch groups are configured to sequentially transmit the fail addresses to the comparing section in response to the cam enable signals, respectively.