发明名称 N/P MOS FinFET performance enhancement by specific orientation surface
摘要 As will be appreciated in more detail herein, the present disclosure provides for FinFET techniques whereby a FinFET channel region has a particular orientation with respect to the crystalline lattice of the semiconductor device to provide enhanced mobility, compared to conventional FinFETs. In particular, the present disclosure provides FinFETs with a channel region whose lattice includes silicon atoms arranged on (551) lattice plane. In this configuration, the sidewalls of the channel region are particularly smooth at the atomic level, which tends to promote higher carrier mobility and higher device performance than previously achievable.
申请公布号 US9209304(B2) 申请公布日期 2015.12.08
申请号 US201414179585 申请日期 2014.02.13
申请人 Taiwan Semiconductor Manufacturing Co., Ltd. 发明人 Hsiao Ru-Shang;Chen Hung Pin;Chen Wei-Barn;Chang Chih-Fu;Chao Chih-Kang;Wang Ling-Sung
分类号 H01L29/78 主分类号 H01L29/78
代理机构 Eschweiler & Associates, LLC 代理人 Eschweiler & Associates, LLC
主权项 1. An integrated circuit, comprising: a fin of semiconductor material having a base fin portion having a base fin width, an upper fin portion having an upper fin width, and outer fin sidewalls extending upwardly from the base fin portion to the upper fin portion, wherein an outer sidewall of the fin is disposed on a (551) lattice plane, a conductive gate electrode straddling a channel region of the fin and having a gate dielectric separating the conductive gate electrode from the channel region; source and drain regions disposed in the fin on opposite edges of the conductive gate electrode; and an undoped polysilicon region extending continuously over the outer fin sidewall and the upper fin portion, wherein the undoped polysilicon region is sandwiched between the outer fin sidewall and the gate dielectric.
地址 Hsin-Chu TW