发明名称 Radiation source with a debris mitigation system, lithographic apparatus with a debris mitigation system, method for preventing debris from depositing on collector mirror, and device manufacturing method
摘要 A lithographic apparatus includes a radiation source configured to produce extreme ultraviolet radiation, the radiation source including a chamber in which a plasma is generated; a collector mirror configured to reflect radiation emitted by the plasma; and a debris mitigation system including a gas supply system configured to supply a first gas flow toward the plasma, the first gas flow being selected to thermalize debris generated by the plasma, and a plurality of gas manifolds arranged at a location proximate the collector mirror, the gas manifolds configured to supply a second gas flow in the chamber, the second gas flow being directed toward the plasma to prevent thermalized debris from depositing on the collector mirror.
申请公布号 US9207548(B2) 申请公布日期 2015.12.08
申请号 US200913058776 申请日期 2009.07.30
申请人 ASML NETHERLANDS B.V. 发明人 Banine Vadim Yevgenyevich;Loopstra Erik Roelof;Moors Johannes Hubertus Josephina
分类号 G03F7/20;H05G2/00 主分类号 G03F7/20
代理机构 Pillsbury Winthrop Shaw Pittman LLP 代理人 Pillsbury Winthrop Shaw Pittman LLP
主权项 1. A lithographic apparatus comprising: a radiation source configured to produce extreme ultraviolet radiation, the radiation source including a chamber in which a plasma is generated;a collector mirror having a surface configured to reflect radiation emitted by the plasma towards a focal point; anda debris mitigation system including a gas supply system configured to supply a first gas flow toward the plasma in a direction substantially perpendicular to a direction of propagation of the radiation reflected by the collector mirror towards the focal point to form a gas curtain around the plasma, the first gas flow being selected to thermalize debris generated by the plasma, anda plurality of gas manifolds arranged at a location between the plasma and the surface of the collector mirror and proximate the surface of the collector mirror and extending substantially along a length of the collector mirror, each gas manifold having a diameter and a plurality of gas outlets configured to supply a second gas flow in the chamber, the second gas flow being directed toward the plasma to prevent thermalized debris from depositing on the collector mirror.
地址 Veldhoven NL