发明名称 |
metodo e aparelho para analisar um material |
摘要 |
A method of analyzing particles of a material which include a constituent is disclosed. The method comprises the steps of exposing particles of the material to x radiation having a range of x-radiation energies, detecting x-radiation intensities at two different energy levels transmitted through the particles, and determining the concentration of the constituent in particles from the detected intensities. |
申请公布号 |
BRPI0918531(A2) |
申请公布日期 |
2015.12.08 |
申请号 |
BR2009PI18531 |
申请日期 |
2009.09.08 |
申请人 |
TECHNOLOGICAL RESOURCES PTY LIMITED |
发明人 |
ANDREA GABRIELLE PIDCOCK;ROBIN GREEWOOD-SMITH;TREVOR HEUER |
分类号 |
G01N23/06;G01N23/00 |
主分类号 |
G01N23/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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