发明名称 |
Structure and manufacturing method of the structure, and gallium nitride-based semiconductor light-emitting device using the structure and manufacturing method of the device |
摘要 |
In a structure including a gallium nitride-based semiconductor having an m-plane as a principal plane, and a metal layer provided on the principal plane, the principal plane has an n-type conductivity. An interface between the gallium nitride-based semiconductor and the metal layer contains oxygen. The metal layer includes a crystal grain extending form a lower surface to an upper surface of the metal layer. |
申请公布号 |
US9209254(B2) |
申请公布日期 |
2015.12.08 |
申请号 |
US201414290311 |
申请日期 |
2014.05.29 |
申请人 |
Panasonic Intellectual Property Management Co., Ltd. |
发明人 |
Fujikane Masaki;Inoue Akira;Yokogawa Toshiya |
分类号 |
H01L29/20;H01L21/02;H01L33/40;H01L33/32;H01L33/16 |
主分类号 |
H01L29/20 |
代理机构 |
Renner, Otto, Biosselle & Sklar, LLP |
代理人 |
Renner, Otto, Biosselle & Sklar, LLP |
主权项 |
1. A structure, comprising:
a gallium nitride-based semiconductor layer having an m-plane as a principal plane; and a silver layer provided on the principal plane, wherein the principal plane has an n-type conductivity, an interface between the gallium nitride-based semiconductor layer and the silver layer contains oxygen, the silver layer includes a crystal grain extending from a lower surface to an upper surface of the silver layer, and an oxygen concentration at the interface between the gallium nitride-based semiconductor layer and the silver layer is not less than 30 times and not more than 200 times an oxygen concentration in the silver layer. |
地址 |
Osaka JP |