发明名称 Method for evaluating bit error rate for a magnetic head by using a quasi-static test system, and system thereof
摘要 A method for evaluating bit error rate for a magnetic head by using a quasi-static test system, includes step (a), measuring a noise characteristic curve for a magnetic head, and the noise characteristic comprising noise amplitude and maximum noise amplitude; step (b), constructing a noise waveform by appropriately scaling a signal noise ratio of the magnetic head based on the noise characteristic curve measured in step (a); and step (c), injecting the noise waveform constructed in step (b) into a model comprising a transmitter module and a receiver module to evaluate a bit error rate. The method saves testing time, reduces manpower, and obtains accuracy testing result.
申请公布号 US9208805(B1) 申请公布日期 2015.12.08
申请号 US201414584072 申请日期 2014.12.29
申请人 SAE Magnetics (H.K) Ltd. 发明人 Ow Wai Bun;Lam Ho Kei;Lui Cheuk Man;Cheung Kai Chiu;Lo Yuk Sing;Chan Wah Chun;Ding Juren
分类号 G11B27/36;G11B5/10;G11B5/455;G11B20/18;G11B20/10;G11B20/12;G01R33/12 主分类号 G11B27/36
代理机构 Nixon & Vanderhye PC 代理人 Nixon & Vanderhye PC
主权项 1. A method for evaluating bit error rate for a magnetic head by using a quasi-static test system, comprising: step (a), measuring a noise characteristic curve for a magnetic head, and the noise characteristic comprising noise amplitude and maximum noise amplitude; step (b), constructing a noise waveform by appropriately scaling a signal noise ratio of the magnetic head based on the noise characteristic curve measured in step (a); and step (c), injecting the noise waveform constructed in step (b) into a model comprising a transmitter module and a receiver module to evaluate a bit error rate.
地址 Hong Kong CN