发明名称 Internal address generation circuits
摘要 Internal address generation circuits are provided. The internal address generation circuit includes an aging detector and an address decoder. The aging detector generates an aging signal enabled when the number of times that an internal command signal for accessing memory cells is inputted is equal to or more than a reference number. The address decoder decodes an address signal in response to the aging signal to generate an internal address signal.
申请公布号 US9208843(B2) 申请公布日期 2015.12.08
申请号 US201414175734 申请日期 2014.02.07
申请人 SK Hynix Inc. 发明人 Cheon Kwonsu
分类号 G11C8/10;G11C8/18 主分类号 G11C8/10
代理机构 William Park & Associates Ltd. 代理人 William Park & Associates Ltd.
主权项 1. An internal address generation circuit, the circuit comprising: an aging detector suitable for generating an aging signal enabled when the number of times that an internal command signal for accessing memory cells is inputted is equal to or more than a reference number; and an address decoder suitable for decoding an address signal in response to the aging signal to generate an internal address signal, wherein the internal address signal includes a first internal address signal and a second internal address signal, wherein when the aging signal is disabled, the address decoder decodes the address signal having a first level combination to generate the first internal address signal enabled and decodes the address signal having a second level combination to generate the second internal address signal enabled, and wherein when the aging signal is enabled, the address decoder decodes the address signal having the first level combination to generate the second internal address signal enabled and decodes the address signal having the second level combination to generate the first internal address signal enabled.
地址 Gyeonggi-do KR