| 发明名称 | Inspection apparatus | ||
| 摘要 | An inspection apparatus includes an insulating substrate, a socket in which a body portion having a through-hole in a wall thereof is integrally formed with a connection portion secured to the insulating substrate, and a contact probe detachably secured to the socket. | ||
| 申请公布号 | US9207257(B2) | 申请公布日期 | 2015.12.08 |
| 申请号 | US201313784727 | 申请日期 | 2013.03.04 |
| 申请人 | Mitsubishi Electric Corporation | 发明人 | Okada Akira;Akiyama Hajime;Yamashita Kinya |
| 分类号 | G01R31/00;G01R1/067;G01R1/44;G01R3/00;G01R1/04 | 主分类号 | G01R31/00 |
| 代理机构 | Studebaker & Brackett PC | 代理人 | Studebaker & Brackett PC |
| 主权项 | 1. An inspection apparatus comprising: an insulating substrate; a cylindrically-shaped hollow socket that includes a top, a bottom and a body portion in which the body portion includes a through-hole in a side wall thereof, the socket being integrally formed with a connection portion at the top of the socket secured to said insulating substrate; and an elongated and electrically-conductive contact probe detachably secured to said a socket at the bottom of the socket, wherein the through-hole is configured to enhance heat dissipation of the socket and the contact probe. | ||
| 地址 | Tokyo JP | ||