| 摘要 |
PROBLEM TO BE SOLVED: To provide an optical device inspection apparatus capable of expediting an inspection speed while performing a plurality of inspections.SOLUTION: The optical device inspection apparatus comprises a transport unit for transporting a long-sized element base in which a plurality of optical devices having a light extraction surface are arrayed in the longitudinal direction, a power feeding unit for feeding electric power to the optical devices being transported by the transport unit, and a light detection unit disposed on the light extraction surface side of the optical devices supplied with electric power by the power feeding unit in a state in which they are transported by the transport unit. The light detection unit has a plurality of line sensors having a plurality of photoelectric conversion elements arrayed in a direction orthogonal to the direction of element base transportation, the plurality of line sensors being arrayed in a direction along the direction of transportation by the transport unit. |
