发明名称 SIGNAL LIGHT QUALITY MEASURING DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide a signal light quality measuring device capable of measuring a nonlinear noise component and a noise component of natural emission light included in a signal light with a simple configuration at a low cost.SOLUTION: The signal light quality measuring device includes: a wavelength variable filter 41 to which various beams of signal light each having different power are input; a measurement section 42 that measures the light power passing through the wavelength variable filter 41; and a control section 43 that calculates the nonlinear noise component and the noise component of natural emission light which are included in the signal light based on the light power measured by the measurement section 42 at different transmission frequency on each of the signal light having power different from each other according to the transmission frequency control by the wavelength variable filter 41.
申请公布号 JP2015220591(A) 申请公布日期 2015.12.07
申请号 JP20140102516 申请日期 2014.05.16
申请人 FUJITSU LTD 发明人 YAMAUCHI TOMOHIRO;ODA SHOICHIRO
分类号 H04B10/075 主分类号 H04B10/075
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