发明名称 DETECTOR, LITHOGRAPHIC APPARATUS AND ARTICLE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a detector which is advantageous in improving measuring accuracy.SOLUTION: A detector is used to detect a mark 2 having a periodic structure and comprises: an illumination optical system for emitting light to the mark 2; a light receiving optical system 11 for receiving diffraction light from the mark 2 when a relative position between the illumination optical system and the mark 2 are being changed in a measurement direction; and a light receiving element 16 for detecting diffraction light from the light receiving optical system 11. Here, the number of openings in the measurement direction on the light receiving optical system 11 is greater than the number of openings on the light receiving optical system in a non-measurement direction on a plane provided with the mark 2.
申请公布号 JP2015220343(A) 申请公布日期 2015.12.07
申请号 JP20140102990 申请日期 2014.05.19
申请人 CANON INC 发明人 CHITOKU KOICHI;YAMAGUCHI WATARU;NISHIDA TOSHIHIKO;INA HIDEKI
分类号 H01L21/027;G01B11/00;G03F9/00 主分类号 H01L21/027
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