发明名称 SINGLE ALD CYCLE THICKNESS CONTROL IN MULTI-STATION SUBSTRATE DEPOSITION SYSTEMS
摘要 PROBLEM TO BE SOLVED: To provide methods of depositing films of material on multiple semiconductor substrates in a multi-station processing chamber.SOLUTION: A method comprises: loading a first substrate onto a station 201 through a handler robot 226; performing N cycles of deposition; rotating a carousel 290 by 90 degrees to transfer the first substrate to a station 202; loading a second substrate onto the station 201; performing another N cycles of deposition; and then continuing similar processes until the first substrate experiences N cycles of deposition at each of processing stations 201, 202, 203 and 204 and the second substrate experiences N cycles of deposition at each of the stations 201, 202 and 203 with deposition at 204 to occur next.
申请公布号 JP2015220458(A) 申请公布日期 2015.12.07
申请号 JP20150095293 申请日期 2015.05.08
申请人 LAM RESEARCH CORPORATION 发明人 ROMUALD NOWAK;KANG HU;ADRIEN LAVOIE;QIAN JUN
分类号 H01L21/31;C23C16/455;C23C16/52;H01L21/314;H01L21/316;H01L21/318 主分类号 H01L21/31
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