发明名称 SEMICONDUCTOR DEVICE AND SEMICONDUCTOR SYSTEM EQUIPPED WITH THE SAME
摘要 PROBLEM TO BE SOLVED: To perform a calibration operation with less error.SOLUTION: A semiconductor device comprises: a plurality of pull-down units PDR1-PDR5 which are connected in parallel with each other between a calibration terminal ZQ and power supply wiring SL; a pull-up unit PUR and a pull-down unit PDR0 connected in series between the power supply wiring SL and power supply wiring VL. The pull-down units PDR0-PDR5 each includes a transistor part TRD and a high resistance wiring part RW, which are formed to be capable of adjusting impedance depending on a code signal CODEPD. A resistance value of the high resistance wiring part RW of each of the pull-down units PDR1-PDR5 and a resistance value of the high resistance wiring part RW of the pull-down unit PDR0 are different from each other. According to the present embodiment, a calibration operation with less error can be performed even when a reference level is off set from 1/2 of power supply potential.
申请公布号 JP2015220491(A) 申请公布日期 2015.12.07
申请号 JP20140100509 申请日期 2014.05.14
申请人 MICRON TECHNOLOGY INC 发明人 TANIGUCHI ATSUNORI;ISHII TOSHINAO;ARAI TETSUYA
分类号 H03K19/0175;H01L21/822;H01L21/8234;H01L27/04;H01L27/06 主分类号 H03K19/0175
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