发明名称 |
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR SYSTEM EQUIPPED WITH THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To perform a calibration operation with less error.SOLUTION: A semiconductor device comprises: a plurality of pull-down units PDR1-PDR5 which are connected in parallel with each other between a calibration terminal ZQ and power supply wiring SL; a pull-up unit PUR and a pull-down unit PDR0 connected in series between the power supply wiring SL and power supply wiring VL. The pull-down units PDR0-PDR5 each includes a transistor part TRD and a high resistance wiring part RW, which are formed to be capable of adjusting impedance depending on a code signal CODEPD. A resistance value of the high resistance wiring part RW of each of the pull-down units PDR1-PDR5 and a resistance value of the high resistance wiring part RW of the pull-down unit PDR0 are different from each other. According to the present embodiment, a calibration operation with less error can be performed even when a reference level is off set from 1/2 of power supply potential. |
申请公布号 |
JP2015220491(A) |
申请公布日期 |
2015.12.07 |
申请号 |
JP20140100509 |
申请日期 |
2014.05.14 |
申请人 |
MICRON TECHNOLOGY INC |
发明人 |
TANIGUCHI ATSUNORI;ISHII TOSHINAO;ARAI TETSUYA |
分类号 |
H03K19/0175;H01L21/822;H01L21/8234;H01L27/04;H01L27/06 |
主分类号 |
H03K19/0175 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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