发明名称 |
VARIABLE RESISTANCE MEMORY DEVICES AND METHODS OF MANUFACTURING THE SAME |
摘要 |
A variable resistance memory device includes: a plurality of memory cells which are individually arranged in respective intersection parts of first conductive lines extended in first direction and second conductive lines extended in a second direction, and include a variable resistance device; a plurality of first insulating patterns which are extended in the first direction between the memory cells; a plurality of second insulating patterns which are extended in the second direction between the memory cells; a plurality of first column barrier layer patterns which are separated from the memory cells in the second direction between the insulating layer patterns, and are extended in the first direction; and a plurality of second column barrier layer patterns which are separated from the memory cells in the second direction between the insulating layer patterns, and are extended in the second direction. |
申请公布号 |
KR20150135804(A) |
申请公布日期 |
2015.12.04 |
申请号 |
KR20140062767 |
申请日期 |
2014.05.26 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JUNG, SEUNG JAE;KANG, YOUN SEON |
分类号 |
H01L27/115;H01L21/31;H01L21/768;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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