发明名称 VARIABLE RESISTANCE MEMORY DEVICES AND METHODS OF MANUFACTURING THE SAME
摘要 A variable resistance memory device includes: a plurality of memory cells which are individually arranged in respective intersection parts of first conductive lines extended in first direction and second conductive lines extended in a second direction, and include a variable resistance device; a plurality of first insulating patterns which are extended in the first direction between the memory cells; a plurality of second insulating patterns which are extended in the second direction between the memory cells; a plurality of first column barrier layer patterns which are separated from the memory cells in the second direction between the insulating layer patterns, and are extended in the first direction; and a plurality of second column barrier layer patterns which are separated from the memory cells in the second direction between the insulating layer patterns, and are extended in the second direction.
申请公布号 KR20150135804(A) 申请公布日期 2015.12.04
申请号 KR20140062767 申请日期 2014.05.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG, SEUNG JAE;KANG, YOUN SEON
分类号 H01L27/115;H01L21/31;H01L21/768;H01L21/8247 主分类号 H01L27/115
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