| 摘要 |
Disclosed is a probe station for a double-side test. The probe station for a double-side test according to the present invention includes: a supporting leg which is supported on the ground; a horizontal support fixture which is horizontally installed on an upper part of the support leg; a plurality of vertical poles which are vertically installed to be erected on an upper part of the horizontal support fixture; a plurality of guide beams which are connected to an upper part of the vertical pole longitudinally; a rack which is movably combined to the guide beam and is installed with a scope; a first and a second support which comprise a supporter vertically installed on the upper part of the horizontal support fixture and a support formed on the upper part of the supporter horizontally, and are installed on the upper part of the horizontal support fixture as separated at a fixed interval; an installation board which has both ends combined to a hinge part formed on the support of the first and the second support to maintain a rotary and fixed state, and is installed with an object; and a side test part comprising a base which is combined to one side of the upper part of the horizontal support fixture and is combined to be horizontally movable, a rod which is vertically combined to the upper part of the base and is elevated, a positioner platen which is formed on an upper part of the rod to be in parallel with the base, and an arm which is combined to the positioner platen to face the installation board, and is installed with the scope. |
