| 摘要 |
PROBLEM TO BE SOLVED: To provide a self-luminous material image processing apparatus configured to measure a width of a self-luminous material accurately, without influence of a defect or luminance unevenness near an edge, and a self-luminous material image processing method.SOLUTION: A self-luminous material image processing apparatus detects both edge positions of a self-luminous material in a width direction from each of a plurality of pixel arrays extending along the width direction of the self-luminous material in an image, acquires a lateral length in each of the pixel arrays from two edge positions in each of the pixel arrays, selects a plurality of lateral lengths within a specific range of the order of length, from among the acquired lateral lengths, and acquires an average value of the selected lateral lengths, as a length of the material. |
