发明名称 RESISTANCE CHANGE TYPE MEMORY
摘要 A resistance change type memory includes a memory cell including a first resistance change element as a memory element; a reference cell including a second resistance change element and a first element having a resistance value which is not higher than a resistance range of the first and second resistance change elements; and a read circuit including a first input terminal connected to the memory cell, and a second input terminal connected to the reference cell.
申请公布号 US2015348625(A1) 申请公布日期 2015.12.03
申请号 US201514825844 申请日期 2015.08.13
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 HATSUDA Kosuke
分类号 G11C13/00 主分类号 G11C13/00
代理机构 代理人
主权项 1. A resistance change type memory comprising: a memory cell including a first resistance change element as a memory element; a reference cell including a second resistance change element including the same materials as the first resistance change element, and a first element, the first element having a resistance value which is not higher than a resistance range of the first and second resistance change elements; and a read circuit including a first input terminal connected to the memory cell, and a second input terminal connected to the reference cell, wherein when data is read out from a memory cell, first and second electric currents, which are less than a threshold at which resistance states of the first and second resistance change elements are changed, are supplied to a memory cell selected for reading out data and to the reference cell, respectively, the second electric current flowing in the second resistance change element in a direction identical to a direction in which the resistance state of the second resistance change element changes from a first resistance state of a first resistance value to a second resistance state of a second resistance value which is higher than the first resistance value, and the first element is a transistor.
地址 Tokyo JP
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