| 摘要 |
PROBLEM TO BE SOLVED: To provide an optical waveguide inspection method with which it is possible to efficiently carry out inspection.SOLUTION: This optical waveguide inspection method includes: an image-capturing step for irradiating the optical input units 25 of optical waveguide units 20a-20c with inspection light from a light irradiation unit, capturing the images of optical output units 23 of the optical waveguides by an image-capturing unit, and generating image data; an acceptance determination step for analyzing the image data, calculating the positions, dimensions and shapes of the optical output units 23 and/or the relative loss of light of a core pattern 21, and determining whether or not the optical waveguides are acceptable on the basis of the calculation result; and a movement step for moving an optical waveguide aggregate 1 and the light irradiation and image-capturing units in the direction Y relatively to each other in a state in which the physical relationship of the light irradiation unit and image-capturing units is defined. |
