发明名称 MOSFET HAVING DUAL-GATE CELLS WITH AN INTEGRATED CHANNEL DIODE
摘要 A semiconductor device includes MOSFET cells having a drift region of a first conductivity type. A first and second active area trench are in the drift region. A split gate uses the active trenches as field plates or includes planar gates between the active trenches including a MOS gate electrode (MOS gate) and a diode gate electrode (diode gate). A body region of the second conductivity type in the drift region abutts the active trenches. A source of the first conductivity type in the body region includes a first source portion proximate to the MOS gate and a second source portion proximate to the diode gate. A vertical drift region uses the drift region below the body region to provide a drain. A connector shorts the diode gate to the second source portion to provide an integrated channel diode. The MOS gate is electrically isolated from the first source portion.
申请公布号 US2015349110(A1) 申请公布日期 2015.12.03
申请号 US201414291967 申请日期 2014.05.30
申请人 Texas Instruments Incorporated 发明人 KOCON CHRISTOPHER BOGUSLAW
分类号 H01L29/78;H01L29/10;H01L29/423;H01L23/50;H01L27/06;H01L29/40;H01L29/861 主分类号 H01L29/78
代理机构 代理人
主权项 1. A semiconductor device, comprising: a substrate; a metal oxide semiconductor field effect transistor (MOSFET) cell including: a drift region of a first conductivity type in the substrate;active trenches formed adjacent to said drift region, said active trenches including an electrically conductive filler material surrounded by a trench dielectric liner;a split gate comprising a MOS gate and a diode gate over said drift region and between said active trenches, said split gate using said active trenches as field plates;a body region of a second conductivity type opposite from said first conductivity type abutting said active trenches, and the body region including a first body region proximate to said MOS gate and a second body region proximate to said diode gate;a source region of said first conductivity type formed in said body region, the source region including a first source portion proximate to said MOS gate and a second source portion proximate to said diode gate;a drain having a drain contact formed on a bottom side of said substrate opposing from the split gate, anda connector connecting said diode gate to said second source portion to form a channel diode integrated to a MOSFET controlled by said MOS gate, wherein said MOS gate is electrically isolated from said first source portion.
地址 Dallas TX US