发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 A semiconductor device includes a substrate having a first side and a second side opposite to the first side; a through substrate via (TSV) structure protruding from a surface of the substrate on the second side; a block layer conformally covering the surface of the substrate and the TSV structure; a first dielectric layer covering the block layer except for a portion of the block layer that is directly on the TSV structure; a second dielectric layer on the first dielectric layer; and a damascened circuit pattern in the second dielectric layer. The second dielectric layer is in direct contact with the first dielectric layer. The damascened circuit pattern is in direct contact with the TSV structure.
申请公布号 US2015348871(A1) 申请公布日期 2015.12.03
申请号 US201414289664 申请日期 2014.05.29
申请人 INOTERA MEMORIES, INC. 发明人 Chiang Hsu;Hu Yaw-Wen;Shih Neng-Tai;Lee Tzung-Han
分类号 H01L23/48;H01L23/50 主分类号 H01L23/48
代理机构 代理人
主权项 1. A semiconductor device, comprising: a substrate having a first side and a second side opposite to the first side; a through substrate via (TSV) structure protruding from a surface of the substrate on the second side; a block layer conformally covering the surface of the substrate and the TSV structure; a first dielectric layer covering the block layer except for a portion of the block layer that is directly on the TSV structure; a second dielectric layer on the first dielectric layer, wherein the second dielectric layer is in direct contact with the first dielectric layer; and a damascened circuit pattern in the second dielectric layer, wherein the damascened circuit pattern is in direct contact with the TSV structure.
地址 Taoyuan TW