发明名称 CONTINUOUS PLASMA ETCH PROCESS
摘要 A method for processing a substrate in a process chamber is provided. A plurality of cycles is provided to process the substrate, wherein each cycle comprises the steps of providing a flow of a first process gas into the process chamber, stopping the flow of the first process gas into the process chamber, providing a flow of a first transition gas into the process chamber, wherein the first transition gas neutralizes a component of the first process gas, stopping the flow of the first transition gas into the process chamber, providing a flow of a second process gas into the process chamber, stopping the second process gas into the process chamber, and maintaining a continuous plasma during the cycle.
申请公布号 US2015348792(A1) 申请公布日期 2015.12.03
申请号 US201514825115 申请日期 2015.08.12
申请人 Lam Research Corporation 发明人 LEE Wonchul;FU Qian
分类号 H01L21/3065;H01L21/67;H01J37/32 主分类号 H01L21/3065
代理机构 代理人
主权项 1. A method for processing a substrate in a process chamber, comprising: providing a plurality of cycles to process the substrate, wherein each cycle comprises the steps of: providing a flow of a first process gas into the process chamber;stopping the flow of the first process gas into the process chamber;providing a flow of a first transition gas into the process chamber, wherein the first transition gas neutralizes a component of the first process gas;stopping the flow of the first transition gas into the process chamber;providing a flow of a second process gas into the process chamber;stopping the second process gas into the process chamber; andmaintaining a continuous plasma during the cycle.
地址 Fremont CA US