发明名称 PROBE PIN AND IC SOCKET
摘要 PROBLEM TO BE SOLVED: To provide a probe pin that offers stable electrical continuity between a movable member, comprising an electrically conductive plate-like body, and a densely wound portion of a coil spring.SOLUTION: A probe pin comprises a movable member having an electrode contact portion at one end, and a coil spring. The coil spring comprises a coarsely wound portion obtained by compressibly winding a wire to leave space between windings, and a densely wound portion obtained by densely winding the wire. The movable member is a plate-like member having two first arms which face each other with a first slit in between and are elastically deformable in a direction to narrow the first slit. Length between outer side faces of the two first arms near the end portions thereof is greater than an inner diameter of the densely wound portion of the coil spring when the first arms are not elastically deformed. The movable member is elastically deformed in the direction to narrow the first slit before being inserted to an inner side of the coil spring from its end on the coarsely wound side until a locking part locks an end of the coil spring on the coarsely wound side. The outer side faces of the first arms near the end portions thereof and inner surface of the coil spring can be moved relative to each other while maintaining electrical contact therebetween.
申请公布号 JP2015215328(A) 申请公布日期 2015.12.03
申请号 JP20140195895 申请日期 2014.09.25
申请人 OKUMA KATSUNORI 发明人 OKUMA MASASHI
分类号 G01R1/067;H01L21/66 主分类号 G01R1/067
代理机构 代理人
主权项
地址