发明名称 SYSTEM AND METHOD FOR AUTOMATED LOSS TESTING
摘要 A method and device for analyzing time domain waveforms traveling in electronic interconnect for the purpose of measuring the attenuation. This includes the use of an automated processing system and method to transmit a TDR step pulse into one end of an interconnect and to record the time domain waveform response from the same end of the interconnect. The processing algorithms separate the portions of the collected time domain waveform which contain return loss and insertion loss information and process each portion of that waveform data through FFT techniques to extract the frequency dependent loss data. The method describes the calibration techniques required to achieve these measurements and the device utilized can be a manual or robotic probing system.
申请公布号 US2015349899(A1) 申请公布日期 2015.12.03
申请号 US201414293085 申请日期 2014.06.02
申请人 Introbotics Corporation 发明人 Butler Brian D.;Works David L.
分类号 H04B17/15;H04B1/04 主分类号 H04B17/15
代理机构 代理人
主权项 1. A method for determining attenuation of a device under test (DUT), the method comprising the steps of: inserting a step through a RF probe; saving a calibrated reflected step waveform; inserting the step through the RF probe, wherein the probe is in contact with the DUT; saving the measured reflected step waveform; windowing the calibrated reflected step waveform and the measured reflected step waveform; and calculating a return loss from the windowed waveforms.
地址 Albuquerque NM US