发明名称 Dummy Structure for Chip-on-Wafer-on-Substrate
摘要 Apparatus, and methods of manufacture thereof, in which metal is deposited into openings, thus forming a plurality of metal pads, a plurality of through-silicon-vias (TSVs), a plurality of metal lines, a plurality of first dummy structures, and a plurality of second dummy structures. Ones of the plurality of first dummy structures each have a first width that is at least about three times greater than a second width of each of the plurality of metal lines, and ones of the plurality of second dummy structures each have a third width that is at least about five times greater than the second width of each of the plurality of metal lines.
申请公布号 US2015348872(A1) 申请公布日期 2015.12.03
申请号 US201414289819 申请日期 2014.05.29
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Kuo Pei-Ching;Chen Yi-Hsiu;Yeh Jun-Lin;Lin Yung-Chi;Hsu Li-Han;Wu Wei-Cheng;Yang Ku-Feng;Chiou Wen-Chih
分类号 H01L23/48;H01L23/00;H01L23/528;H01L21/768 主分类号 H01L23/48
代理机构 代理人
主权项 1. An apparatus, comprising: a substrate; a dielectric layer disposed over the substrate; a plurality of metal pads disposed in the dielectric layer; a plurality of through-silicon-vias (TSVs) extending into the substrate, wherein each of the plurality of through-silicon-vias (TSVs) is located below a corresponding one of the plurality of metal pads; a plurality of metal lines disposed in the dielectric layer; a plurality of first dummy structures disposed in the dielectric layer, wherein each of the plurality of first dummy structures has a first width that is at least about three times greater than a second width of each of the plurality of metal lines; and a plurality of second dummy structures disposed in the dielectric layer, wherein each of the plurality of second dummy structures has a third width that is at least about five times greater than the second width of each of the plurality of metal lines.
地址 Hsin-Chu TW