发明名称 |
Dummy Structure for Chip-on-Wafer-on-Substrate |
摘要 |
Apparatus, and methods of manufacture thereof, in which metal is deposited into openings, thus forming a plurality of metal pads, a plurality of through-silicon-vias (TSVs), a plurality of metal lines, a plurality of first dummy structures, and a plurality of second dummy structures. Ones of the plurality of first dummy structures each have a first width that is at least about three times greater than a second width of each of the plurality of metal lines, and ones of the plurality of second dummy structures each have a third width that is at least about five times greater than the second width of each of the plurality of metal lines. |
申请公布号 |
US2015348872(A1) |
申请公布日期 |
2015.12.03 |
申请号 |
US201414289819 |
申请日期 |
2014.05.29 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Kuo Pei-Ching;Chen Yi-Hsiu;Yeh Jun-Lin;Lin Yung-Chi;Hsu Li-Han;Wu Wei-Cheng;Yang Ku-Feng;Chiou Wen-Chih |
分类号 |
H01L23/48;H01L23/00;H01L23/528;H01L21/768 |
主分类号 |
H01L23/48 |
代理机构 |
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代理人 |
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主权项 |
1. An apparatus, comprising:
a substrate; a dielectric layer disposed over the substrate; a plurality of metal pads disposed in the dielectric layer; a plurality of through-silicon-vias (TSVs) extending into the substrate, wherein each of the plurality of through-silicon-vias (TSVs) is located below a corresponding one of the plurality of metal pads; a plurality of metal lines disposed in the dielectric layer; a plurality of first dummy structures disposed in the dielectric layer, wherein each of the plurality of first dummy structures has a first width that is at least about three times greater than a second width of each of the plurality of metal lines; and a plurality of second dummy structures disposed in the dielectric layer, wherein each of the plurality of second dummy structures has a third width that is at least about five times greater than the second width of each of the plurality of metal lines. |
地址 |
Hsin-Chu TW |