发明名称 SINGLE EVENT UPSET PROTECTION CIRCUIT AND METHOD
摘要 An SEU protection circuit comprises first and second storage means for receiving primary and redundant versions, respectively, of an n-bit wide data value that is to be corrected in case of an SEU occurrence; the correction circuit requires that the data value be a 1-hot encoded value. A parity engine performs a parity operation on the n bits of the primary data value. A multiplexer receives the primary and redundant data values and the parity engine output at respective inputs, and is arranged to pass the primary data value to an output when the parity engine output indicates ‘odd’ parity, and to pass the redundant data value to the output when the parity engine output indicates ‘even’ parity. The primary and redundant data values are suitably state variables, and the parity engine is preferably an n-bit wide XOR or XNOR gate.
申请公布号 US2015347222(A1) 申请公布日期 2015.12.03
申请号 US201414290648 申请日期 2014.05.29
申请人 Teledyne Scientific & Imaging, LLC 发明人 WALLNER JOHN;Gorder Michael
分类号 G06F11/10 主分类号 G06F11/10
代理机构 代理人
主权项 1. A single event upset (SEU) correction circuit for n-bit wide data values, comprising: first and second storage means for receiving primary and redundant versions, respectively, of an n-bit wide data value that is to be corrected in case of an SEU occurrence, said data values being 1-hot encoded values; a parity engine arranged to perform a parity operation on the n bits of said primary data value and to provide the results of said operation at an output; and a multiplexer connected to receive said primary data value, said redundant data value, and said parity engine output at respective inputs, said multiplexer arranged to pass said primary data value to an output when said parity engine output indicates ‘odd’ parity and to pass said redundant data value to said output when said parity engine output indicates ‘even’ parity.
地址 Thousand Oaks CA US