In described examples, an integrated circuit (100) containing a well resistor (110) has STI field oxide (108) and resistor dummy active areas (118) in the well resistor (110). STI trenches are etched and filled with trench fill dielectric material. The trench fill dielectric material is removed from over the active areas (118) by a CMP process, leaving STI field oxide (108) in the STI trenches. Subsequently, dopants are implanted into a substrate (102) in the well resistor area to form the well resistor (110).
申请公布号
WO2015183964(A1)
申请公布日期
2015.12.03
申请号
WO2015US32690
申请日期
2015.05.27
申请人
TEXAS INSTRUMENTS INCORPORATED;TEXAS INSTRUMENTS JAPAN LIMITED
发明人
HEINRICH-BARNA, STEPHEN, KEITH;VERRET, DOUGLAS, P.;TSAO, ALWIN, J.