发明名称 A MANUFACTURING METHOD OF A THIN FILM TRANSISTOR AND PIXEL UNIT THEREOF
摘要 The present invention provides a method of manufacturing a thin film transistor and a pixel unit thereof, comprising: forming a metal oxide layer, a gate insulating layer, a gate metal layer and an etching barrier layer on a substrate; through the same mask, etching a part of the etching barrier layer, the gate metal layer and the gate insulating layer on the substrate, while retaining: the metal oxide layer, the gate insulating layer, the gate metal layer and the etching barrier layer in a gate region, and the part of the metal oxide layer, the gate insulating layer and the gate metal layer in source and drain regions for forming contact vias; and exposing the remaining metal oxide layer in the source region and in the drain region; depositing a passivation layer, etching and metallizing the exposed oxide in the source and drain regions to form the source and drain contact vias.
申请公布号 US2015349098(A1) 申请公布日期 2015.12.03
申请号 US201314373308 申请日期 2013.02.06
申请人 SHENZHEN ROYOLE TECHNOLOGIES CO., LTD. 发明人 YU Xiaojun;WEI Peng;LIU Zihong
分类号 H01L29/66;H01L27/12;H01L29/417;H01L21/441;H01L21/4757;H01L29/786;H01L21/4763 主分类号 H01L29/66
代理机构 代理人
主权项 1. A method of manufacturing a thin film transistor, characterized in that the method comprises the following steps: forming a metal oxide layer, a gate insulating layer, a gate metal layer and an etching barrier layer on a substrate; etching, through a same mask, a part of the etching barrier layer, the gate metal layer and the gate insulating layer on the substrate, retaining: the metal oxide layer, the gate insulating layer, the gate metal layer and the etching barrier layer in a gate region, and a part of the metal oxide layer, the gate insulating layer and the gate metal layer in a source region and a drain region for forming contact vias; and exposing the remaining metal oxide layer in the source region and the drain region; metallizing the exposed part of the metal oxide layer in the source region and the drain region to form a part of a source and a drain, and then depositing a passivation layer; etching the passivation layer, the gate metal layer and the gate insulating layer in the source region and the drain region for forming contact vias, exposing a part of the metal oxide layer in the source region and the drain region for forming contact vias, thereby forming a source contact via and a drain contact via; metallizing the exposed part of the metal oxide layer in the source region and the drain region to connect them respectively with the formed part of the source and the drain for forming a complete source and drain; filling a conductive material into the source contact via and the drain contact via.
地址 Shenzhen, Guangdong CN