发明名称 DEEP GATE-ALL-AROUND SEMICONDUCTOR DEVICE HAVING GERMANIUM OR GROUP III-V ACTIVE LAYER
摘要 Deep gate-all-around semiconductor devices having germanium or group III-V active layers are described. For example, a non-planar semiconductor device includes a hetero-structure disposed above a substrate. The hetero-structure includes a hetero-junction between an upper layer and a lower layer of differing composition. An active layer is disposed above the hetero-structure and has a composition different from the upper and lower layers of the hetero-structure. A gate electrode stack is disposed on and completely surrounds a channel region of the active layer, and is disposed in a trench in the upper layer and at least partially in the lower layer of the hetero-structure. Source and drain regions are disposed in the active layer and in the upper layer, but not in the lower layer, on either side of the gate electrode stack.
申请公布号 US2015349077(A1) 申请公布日期 2015.12.03
申请号 US201514821561 申请日期 2015.08.07
申请人 Pillarisetty Ravi;Rachmady Willy;Le Van H.;Sung Seung Hoon;Kachian Jessica S.;Kavalieros Jack T.;Then Han Wui;Dewey Gilbert;Radosavljevic Marko;Chu-Kung Benjamin;Mukherjee Niloy 发明人 Pillarisetty Ravi;Rachmady Willy;Le Van H.;Sung Seung Hoon;Kachian Jessica S.;Kavalieros Jack T.;Then Han Wui;Dewey Gilbert;Radosavljevic Marko;Chu-Kung Benjamin;Mukherjee Niloy
分类号 H01L29/423;H01L29/205;H01L29/786;H01L29/165;H01L29/06 主分类号 H01L29/423
代理机构 代理人
主权项 1. A non-planar semiconductor device, comprising: a buffer layer disposed on a substrate; an active layer disposed on the buffer layer; a gate electrode stack disposed on and completely surrounding a channel region of the active layer, and is disposed in a trench in the buffer layer; and source and drain regions disposed in the active layer and in the buffer layer, on either side of the gate electrode stack, wherein the gate electrode stack is disposed to a depth in the buffer layer sufficiently below a depth of the source and drain regions in the buffer layer to block a substantial portion of leakage from the source region to the drain region.
地址 Portland OR US