发明名称 MEMORY DEVICE AND MEMORY UNIT
摘要 There are provided a memory device and a memory unit that make it possible to improve retention property of a resistance value in low-current writing. The memory device of the technology includes a first electrode, a memory layer, and a second electrode in order, in which the memory layer includes an ion source layer containing one or more transition metal elements selected from group 4, group 5, and group 6 in periodic table, one or more chalcogen elements selected from tellurium (Te), sulfur (S), and selenium (Se), and one or both of boron (B) and carbon (C), and a resistance change layer having resistance that is varied by voltage application to the first electrode and the second electrode.
申请公布号 US2015349025(A1) 申请公布日期 2015.12.03
申请号 US201314653828 申请日期 2013.12.10
申请人 SONY CORPORATION 发明人 SEI Hiroaki;OHBA Kazuhiro;NONOGUCHI Seiji
分类号 H01L27/24;H01L45/00 主分类号 H01L27/24
代理机构 代理人
主权项 1. A memory device comprising: a first electrode, a memory layer, and a second electrode in order, wherein the memory layer includes an ion source layer containing one or more transition metal elements selected from group 4, group 5, and group 6 in periodic table, one or more chalcogen elements selected from tellurium (Te), sulfur (S), and selenium (Se), and one or both of boron (B) and carbon (C), anda resistance change layer having resistance that is varied by voltage application to the first electrode and the second electrode.
地址 Minato-ku, Tokyo JP