| 发明名称 |
SCAN CHAIN PROCESSING IN A PARTIALLY FUNCTIONAL CHIP |
| 摘要 |
A method for scanning a partially functional chip. The method may include applying a failed core map to the partially functional chip, bypassing at least one failed core scan chain, based on contents of the failed core map. The method may also include performing comparisons of scan status information to the failed core map and inhibiting movement of scan data of at least one failed core, based on results of the comparisons. |
| 申请公布号 |
US2015346280(A1) |
申请公布日期 |
2015.12.03 |
| 申请号 |
US201514825298 |
申请日期 |
2015.08.13 |
| 申请人 |
International Business Machines Corporation |
发明人 |
Douskey Steven M.;Fuhs Ronald E. |
| 分类号 |
G01R31/3177;G06F11/26 |
主分类号 |
G01R31/3177 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method for scanning a partially functional chip, comprising:
applying a failed core map to the partially functional chip; bypassing at least one failed core scan chain, based on contents of the failed core map; performing comparisons of scan status information to the failed core map; and inhibiting movement of scan data of at least one failed core, based on results of the comparisons. |
| 地址 |
Armonk NY US |
