发明名称 DUAL INFRARED BAND APPARATUS AND METHOD FOR THERMALLY MAPPING A COMPONENT IN A HIGH TEMPERATURE COMBUSTION ENVIRONMENT
摘要 Apparatus and method for thermally mapping a component in a high temperature environment. An optical probe (10) has a field of view (14) arranged to encompass a surface of a component (15) to be mapped. The probe (10) captures infrared (IR) emissions in the near or mid IR band. An optical fiber (16) has a field of view to encompass a spot location (18) on the surface of the component within the field of view (14) of the probe (12). The fiber (16) captures emissions in the long IR band. The emissions in the long IR band are indicative of an emittance value at the spot location. This information may be used to calibrate a radiance map of the component generated from the emissions in the near or mid IR band and thus map the absolute temperature of the component regardless of whether the component includes a TBC.
申请公布号 US2015346032(A1) 申请公布日期 2015.12.03
申请号 US201414294530 申请日期 2014.06.03
申请人 Siemens Energy, Inc. 发明人 Baleine Erwan;Spiegelberg Christine P.
分类号 G01J5/00;G02B6/42;G02B6/32;G01J5/10;G01J5/08 主分类号 G01J5/00
代理机构 代理人
主权项 1. An apparatus comprising: an optical probe housed in a viewing tube, the optical probe having a field of view arranged to encompass a surface of a component to be thermally mapped in a high temperature combustion environment of a turbine engine, the optical probe effective to capture infrared (IR) emissions comprising a first band in an IR spectrum, wherein the first band in the IR spectrum comprises a near IR wavelength or comprises a mid IR wavelength, wherein the component of the turbine engine comprises a thermal barrier coating (TBC) subject to emittance variation in the combustion environment of the turbine engine; and an optical fiber housed in the viewing tube, a field of view of the optical fiber arranged to encompass a spot location on the surface of the component disposed within the field of view of the optical probe, the optical fiber effective to capture IR emissions comprising a second band in the IR spectrum, wherein the second band in the IR spectrum comprises a long IR wavelength effective to measure with a higher degree of accuracy emittance values from the TBC than the wavelengths in the first band, the IR emissions in the second band in the IR spectrum indicative of an emittance value of the TBC at the spot location on the surface of the component effective to reduce temperature errors due to the emittance variation of the TBC.
地址 Orlando FL US