| 摘要 |
<p>Apparatus and methods for subjecting a patient to an slit lamp microscopy and/or Goldmann tonometry eye examination are disclosed herein. In some embodiments, the patient is in a side-lying down position at a time of the examination. In some embodiments, it is possible to examine an upper and/or lower eye—for example, a lower eye slightly above a supporting surface. Related apparatus are disclosed herein. In some embodiments, the apparatus includes a bed and/or a headrest and/or a face immobilization assembly are disclosed herein.</p> |
